共 2 条
Spectroscopic imaging of buried layers in 2+1D via tabletop ptychography with high-harmonic EUV illumination
被引:0
|作者:
Gardner, Dennis F.
[1
]
Porter, Christina L.
[1
]
Shanblatt, Elisabeth R.
[1
]
Mancini, Giulia F.
[1
]
Karl, Robert, Jr.
[1
]
Tanksalvala, Michael
[1
]
Bevis, Charles
[1
]
Kapteyn, Henry C.
[1
]
Murnane, Margaret M.
[1
]
Adams, Daniel E.
[1
]
机构:
[1] Univ Colorado, JILA, 440 UCB, Boulder, CO 80303 USA
来源:
关键词:
ptychography;
EUV;
coherent diffractive imaging (CDI);
high-harmonic generation;
COHERENT;
GENERATION;
RESOLUTION;
MODE;
CRYSTALLOGRAPHY;
MICROSCOPY;
PULSES;
D O I:
10.1117/12.2220368
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
We use EUV coherent microscopy to obtain high-resolution images of buried interfaces, with chemical specificity, in 2+1 dimensions. We perform reflection mode, ptychographic, coherent diffractive imaging with tabletop EUV light, at 29nm, produced by high harmonic generation. Our damascene-style samples consist of copper structures inlaid in SiO2, polished nearly flat with chemical mechanical polishing. We obtain images of both an unaltered damascene as well as one buried below a 100nm thick layer of evaporated aluminum. The aluminum is opaque to visible light and thick enough that neither optical microscopy, SEM, nor AFM can access the buried interface. EUV microscopy is able to image the buried structures, non-destructively, in conditions where other techniques cannot.
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页数:6
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