Grain Size Effect on Yield Strength of Titanium Alloy Implanted with Aluminum Ions

被引:3
|
作者
Popova, Natalya [1 ,2 ]
Nikonenko, Elena [1 ,3 ]
Yurev, Ivan [1 ]
Kalashnikov, Mark [2 ]
Kurzina, Irina [4 ]
机构
[1] Tomsk State Univ Architecture & Bldg, 2 Solyanaya Sq, Tomsk 634003, Russia
[2] SB RAS, Inst Strength Phys & Mat Sci, 2-4 Akad Skii Ave, Tomsk 634021, Russia
[3] Natl Res Tomsk Polytech Univ, 30 Lenin Ave, Tomsk 634050, Russia
[4] Natl Res Tomsk State Univ, 36 Lenin Ave, Tomsk 634050, Russia
关键词
D O I
10.1063/1.4937851
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The paper presents a transmission electron microscopy (TEM) study of the microstructure and phase state of commercially pure titanium VT1-0 implanted by aluminum ions. This study has been carried out before and after the ion implantation for different grain size, i.e. 0.3 mu m (ultra-fine grain condition), 1.5 mu m (fine grain condition), and 17 mu m (polycrystalline condition). This paper presents details of calculations and analysis of strength components of the yield stress. It is shown that the ion implantation results in a considerable hardening of the entire thickness of the implanted layer in the both grain types. The grain size has, however, a different effect on the yield stress. So, both before and after the ion implantation, the increase of the grain size leads to the decrease of the alloy hardening. Thus, hardening in ultra-fine and fine grain alloys increased by four times, while in polycrystalline alloy it increased by over six times.
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页数:8
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