Development and validation of non-vertical cylindrical, near-field scanning technique

被引:0
|
作者
AlMahdawi, T
Seguin, G
Mishra, S
机构
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:553 / 556
页数:4
相关论文
共 50 条
  • [1] Non-vertical optical transition in near-field enhanced spectroscopy of graphene
    Pratama, F. R.
    Ukhtary, M. Shoufie
    Saito, Riichiro
    JOURNAL OF PHYSICS-CONDENSED MATTER, 2019, 31 (26)
  • [2] ON CYLINDRICAL NEAR-FIELD SCANNING TECHNIQUES
    APPELHANSEN, J
    IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION, 1980, 28 (02) : 231 - 234
  • [3] Extrapolation of the outside near-field data in the cylindrical scanning
    Ferrara, F.
    Gennarelli, C.
    Guerriero, R.
    Riccio, G.
    Savarese, C.
    ELECTROMAGNETICS, 2008, 28 (05) : 333 - 345
  • [4] Near-Field Signal Correction and Retrieval Technique for Mie Scattering Vertical Scanning Lidar
    Li Shichun
    Ren Teng
    Zhang Penghui
    Gao Yingchun
    Hua Dengxin
    Wang Yufeng
    Song Yuehui
    Gao Fei
    ACTA OPTICA SINICA, 2023, 43 (18)
  • [5] Development of photothermal near-field scanning optical microscope photothermal near-field scanning optical microscope
    Fujinami, M
    Toya, K
    Sawada, T
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (01): : 621 - 623
  • [6] Noise removal technique in near-field millimeter-wave cylindrical scanning imaging system
    Wen, X. (wenxin_203@163.com), 1600, Electromagnetics Academy (38):
  • [7] Scanning near-field optical microscopy by near-field reflectance enhancement: a versatile and valid technique
    Kaupp, G
    Herrmann, A
    JOURNAL OF PHYSICAL ORGANIC CHEMISTRY, 1999, 12 (02) : 141 - 143
  • [8] Interferometric Technique for Scanning Near-Field Microwave Microscopy Applications
    Bakli, Hind
    Haddadi, Kamel
    Lasri, Tuami
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2014, 63 (05) : 1281 - 1286
  • [9] CALIBRATION TECHNIQUE FOR REFRACTED NEAR-FIELD SCANNING OF OPTICAL FIBERS
    YOUNG, M
    APPLIED OPTICS, 1980, 19 (15): : 2479 - 2480
  • [10] Interferometric Technique for Scanning Near-field Microwave Microscopy Applications
    Bakli, H.
    Haddadi, K.
    Lasri, T.
    2013 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC), 2013, : 1694 - 1698