Lead-free flip chip interconnect reliability for DCA and FC-PBGA packages

A variety of Pb-free solders and under bump metallurgies (Cu, Ni, NiP) were investigated for flip chip packaging applications. The result shows that Sn-0.7Cu exhibits the most desirable mechanical properties (shear, tensile, aging, etc.) during deformation under a variety of stress conditions and has the most favorable failure mechanism under both mechanical and thermomechanical stress testing regardless of UBM type. The eutectic Sn-0.7Cu failed through bulk solder while the eutectic Sn-37Pb, Sn-3.5Ag and Sn-3.8Ag-0.7Cu failed at the solder and UBM interface, involving their respective intermetallic compounds. Cu UBM is more favorable for better reliability than NiP UBM from both interface IMC morphology and electromigration points of view. The current carrying capability for all alloys had no failures when stressed up to 2,338 hours at 2.6x10(4) A/cm(2) and 170degreesC. However, when stressed at 5.1X10(4) A/cm(2), there is a significant migration of Pb toward the anode, creating a multiple layered Pb-rich and Sn-rich microstructure. An observation of excessive Ni migration away from the NiP UBM towards the anode after only 30 hours of current stressing at 5.1X10(4) A/cm(2) and 150degreesC raised the reliability concern for solders with NiP UBM, especially for high power applications. The Sn-0.7Cu/Cu UBM and Sn-0.7Cu/Ni UBM exhibit greater than 5,300 cycles of thermal fatigue characteristic life under -55 degreesC /+150 degreesC and -40 degreesC /+125 degreesC air-to-air thermal cycling conditions, respectively.