Spectra mapping of scanning tunneling microscope-induced light from electrochemically deposited Ag films on Au

被引:1
|
作者
Nishitani, R [1 ]
Kasuya, A
Szuba, S
机构
[1] Kyushu Inst Technol, Dept Comp Sci & Elect, Iizuka, Fukuoka 820, Japan
[2] Tohoku Univ, Interdisciplinary Res Ctr, Sendai, Miyagi 98077, Japan
关键词
D O I
10.1116/1.1287155
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have carried out spectra mapping measurements of scanning tunneling microscope (STM)-induced photon emission from electrochemically deposited Ag films on Au. The luminescence spectra for Ag and Au films are recorded at the same time as the STM topography image in air. The spectrally resolved photon intensity map is obtained from the observed 4096 spectra, which shows a correlation with the topography. The luminescence spectra observed for Ag films exhibit a broader band of spectra with a spectral shift toward a shorter wavelength compared with Au films. The spectral modes are compared with the topography of the films. (C) 2000 American Vacuum Society. [S0734-2101(00)05605-0].
引用
收藏
页码:2482 / 2485
页数:4
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