Rapid and accurate measurement for phase-change optical recording bits

被引：4
|
作者：
Chen, Sy-Hann [1 ]
机构：
[1] Natl Chiayi Univ, Dept Appl Phys, Chiayi, Taiwan
来源：
MICROSCOPY RESEARCH AND TECHNIQUE | 2007年 / 70卷 / 04期
关键词：
conducting atomic force microscopy (CAFM); scanning surface potential microscopy (SSPM); digital versatile discs (DVD); rewritable (RW); high-resolution recording bits; phase-change recording materials;
D O I：
10.1002/jemt.20415
中图分类号：
R602 [外科病理学、解剖学]; R32 [人体形态学];
学科分类号：
100101 ;
摘要：
Conducting atomic force microscopy (CAFM) and scanning surface potential microscopy (SSPM) have been used to image the phase-change optical recording bits. Commercially available digital versatile discs (DVD) + rewritable (RW) with initialization process were measured in experiments. Comparing the measurement results of both, the measurement resolution of CAFM is far superior to that of SSPM. With the DVD + RW disc rotating at a linear speed of 3.5 m/s, appropriate writing laser power range, may be precisely identified by CAFM as 10-15 mW. This is sufficient to verify the high-resolution recording bits research method. This new method may also be applied to the development of new types of phase-change recording materials.
引用
收藏
页码：325 / 328
页数：4
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