Electroluminescence Study of Inhomogeneous Carrier Distribution in InGaN Multiple-quantum-well Light-emitting Diode Structures

被引:3
|
作者
Ryu, Han-Youl [1 ]
机构
[1] Inha Univ, Dept Phys, Inchon 402751, South Korea
关键词
InGaN; Light-emitting diode; Carrier transport; TEMPERATURE CHARACTERISTICS; OPTICAL-PROPERTIES;
D O I
10.3938/jkps.56.1256
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Due to the low hole mobility in InGaN materials, hole transport in InGaN/GaN multiple-quantum-well (MQW) structures should be quite inefficient, which could result in an inhomogeneous distribution of hole carriers in the MQWs. in this work, the author investigates the carrier distribution and the transport in dual-wavelength InGaN MQW light-emitting diode (LED) structures emitting around 940 nm and 460 urn. Electroluminescence (EL) spectroscopy has been performed to study the carrier transport characteristics for two LEDs having different MQW layer structures. The inhomogeneous hole carrier distribution is clearly demonstrated from the EL spectra, which shows that most of the emitted light comes from the 460-nm-emitting QWs positioned near the p-side layers for both LED structures. In addition, the hole carrier transport problem and the inhomogeneous hole distribution are also confirmed by simulations of the carrier distribution and the radiative recombination in the studied MQW LED structures.
引用
收藏
页码:1256 / 1260
页数:5
相关论文
共 50 条
  • [1] Factors Determining the Carrier Distribution in InGaN/GaN Multiple-Quantum-Well Light-Emitting Diodes
    Han, Dong-Pyo
    Shim, Jong-In
    Shin, Dong-Soo
    [J]. IEEE JOURNAL OF QUANTUM ELECTRONICS, 2018, 54 (01)
  • [2] Temperature-dependent electroluminescence in InGaN/GaN multiple-quantum-well light-emitting diodes
    Cao, XA
    Leboeuf, SF
    Rowland, LB
    Liu, H
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2003, 32 (05) : 316 - 321
  • [3] Temperature-dependent electroluminescence in InGaN/GaN multiple-quantum-well light-emitting diodes
    X. A. Cao
    S. F. Leboeuf
    L. B. Rowland
    H. Liu
    [J]. Journal of Electronic Materials, 2003, 32 : 316 - 321
  • [4] Red Emission of InGaN/GaN Multiple-Quantum-Well Light-Emitting Diode Structures with Indium-Rich Clusters
    Meng, Yulin
    Wang, Lianshan
    Zhao, Guijuan
    Li, Fangzheng
    Li, Huijie
    Yang, Shaoyan
    Wang, Zhanguo
    [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2018, 215 (23):
  • [5] Carrier distribution in (0001)InGaN/GaN multiple quantum well light-emitting diodes
    David, Aurelien
    Grundmann, Michael J.
    Kaeding, John F.
    Gardner, Nathan F.
    Mihopoulos, Theodoros G.
    Krames, Michael R.
    [J]. APPLIED PHYSICS LETTERS, 2008, 92 (05)
  • [6] Influences of multiquantum barriers on carrier recombination in InGaN/GaN multiple-quantum-well light-emitting diodes
    Nee, Tzer-En
    Wang, Jen-Cheng
    Shen, Hui-Tang
    Wu, Ya-Fen
    Shih, Yu-Tai
    Lu, Chien-Lin
    [J]. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2007, 46 (4 B): : 2413 - 2417
  • [7] Influences of multiquantum barriers on carrier recombination in InGaN/GaN multiple-quantum-well light-emitting diodes
    Nee, Tzer-En
    Wang, Jen-Cheng
    Shen, Hui-Tang
    Wu, Ya-Fen
    Shih, Yu-Tai
    Lu, Chien-Lin
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (4B): : 2413 - 2417
  • [8] Luminescence of an InGaN/GaN multiple quantum well light-emitting diode
    Sheu, JK
    Chi, GC
    Su, YK
    Liu, CC
    Chang, CM
    Hung, WC
    Jou, MJ
    [J]. SOLID-STATE ELECTRONICS, 2000, 44 (06) : 1055 - 1058
  • [9] Spectral electroluminescence mapping of a blue InGaN single quantum well light-emitting diode
    Fischer, P
    Christen, J
    Nakamura, S
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2000, 39 (2B): : L129 - L132
  • [10] Luminescence efficiency of InGaN multiple-quantum-well ultraviolet light-emitting diodes
    Pan, CC
    Lee, CM
    Liu, JW
    Chen, GT
    Chyi, JI
    [J]. APPLIED PHYSICS LETTERS, 2004, 84 (25) : 5249 - 5251