Issues in the design of a test set-up for high-speed A/D converters

被引：0

作者：

Boni, A ^{[1
]}

Chiorboli, G ^{[1
]}

Morandi, C ^{[1
]}

机构：

[1] Univ Parma, Dipartimento Ingn Informaz, I-43100 Parma, Italy

来源：

MEASUREMENT | 2000年 / 28卷 / 02期

关键词：

analog-to-digital converters; design of test-boards; testing; noise;

D O I：

10.1016/S0263-2241(99)00036-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Several factors need to be considered when testing high-speed analog-to-digital converters (ADCs). Just to mention a few, phase noise of the signal generators, proper power supply decoupling, single-ended versus differential input configurations, capacitor versus transformer coupling of input and clock signals. This paper describes the typical problems encountered in the design of test-boards for high-speed ADCs and some of the possible solutions. Simulations and measurement results are provided. (C) 2000 Elsevier Science Ltd. All rights reserved.

引用

页码：105 / 114

页数：10

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