High-frequency diffraction at the edge of a dielectric screen

被引：0

作者：

Tiberio, R ^{[1
]}

Toccafondi, A ^{[1
]}

Mioc, F ^{[1
]}

机构：

[1] Univ Siena, Dept Informat Engn, I-53100 Siena, Italy

来源：

1999 SBMO/IEEE MTT-S INTERNATIONAL MICROWAVE AND OPTOELECTRONICS CONFERENCE, PROCEEDINGS, VOLS 1 & 2: WIRELESS AND PHOTONICS BUILDING THE GLOBAL INFOWAYS | 1999年

关键词：

edge diffraction; dielectric screens; ray method;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A high-frequency solution for the scattering from thin dielectric screens is presented. It is heuristically derived by conveniently modifying the UTD solution for a perfectly conducting half-plane. The final dyadic expression satisfies reciprocity and to the first order, the boundary conditions on the faces of the dielectric screen. Numerical results are presented and compared with the exact solution for an impedance screen.

引用

页码：490 / 492

页数：3

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