Survey, taxonomy, and methods of QCA-based design techniques-part II: reliability and security

被引:2
|
作者
Fazili, Mohammad Mudakir [1 ]
Shah, Mohsin Fayaz [2 ]
Naz, Syed Farah [3 ]
Shah, Ambika Prasad [3 ]
机构
[1] Natl Inst Technol Srinagar, Elect & Commun Engn, Srinagar 190006, Jammu & Kashmir, India
[2] Shri Mata Vaishno Devi Univ, Elect & Commun Engn, Katra 182320, J&K, India
[3] Indian Inst Technol Jammu, Elect Engn Dept, Jammu 181221, Jammu & Kashmir, India
关键词
QCA; fault-tolerant; reliability; security; PUF; TRNG; DOT CELLULAR-AUTOMATA; TOLERANCE; GATE; DEFECTS; ADDER;
D O I
10.1088/1361-6641/ac5ec1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Quantum-dot cellular automata (QCA) is a new and adroit technology currently under extensive research for post-complementary metal-oxide-semiconductor era VLSI chip design. QCA has promised more reliable, fault-tolerant and secure chip designs. In addition, while analyzing QCA circuits for power and energy dissipation, promising results have been reported that suggest that QCA circuits dissipate significantly less energy and operate very close to the Shannon-von Neumann-Landauer limit. Security is another concern that has led to the development of QCA-based security systems such as physically unclonable functions and true random number generators. In this paper, a survey of different fault-tolerant and QCA-based security circuits is provided, along with a discussion of critical design aspects and parameters of QCA technology.
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页数:16
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