Solid and Non-Solid Dielectric Material Characterization for Millimeter and Sub-Millimeter Wave Applications

被引：0
|
作者：
Bourreau, Daniel [1 ]
Peden, Alain [1 ]
机构：
[1] UMR 6285, Lab STICC, Brest, France
来源：
2020 50TH EUROPEAN MICROWAVE CONFERENCE (EUMC) | 2020年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
EuMC47-3
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页数：1
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