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- [2] Water immersion optical lithography for the 45nm node OPTICAL MICROLITHOGRAPHY XVI, PTS 1-3, 2003, 5040 : 679 - 689
- [3] Immersion lithography ready for 45 nm manufacturing and beyond 2007 IEEE/SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE, 2007, : 171 - +
- [4] Integrating immersion lithography in 45-nm logic manufacturing OPTICAL MICROLITHOGRAPHY XX, PTS 1-3, 2007, 6520
- [5] Optical issues of thin organic pellicles in 45nm and 32nm immersion lithography PHOTOMASK TECHNOLOGY 2006, PTS 1 AND 2, 2006, 6349
- [6] High order correction and sampling strategy for 45nm immersion lithography overlay control METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXII, PTS 1 AND 2, 2008, 6922 (1-2):
- [7] The study of Chromeless Phase Lithography (CPL) for 45nm lithography PHOTOMASK TECHNOLOGY 2006, PTS 1 AND 2, 2006, 6349
- [8] RET masks for patterning 45nm node contact hole using ArF immersion lithography PHOTOMASK AND NEXT GENERATION LITHOGRAPHY MASK TECHNOLOGY XIII, PTS 1 AND 2, 2006, 6283
- [9] ArF immersion lithography for 45nm and beyond - art. no. 66071G PHOTOMASK AND NEXT-GENERATION LITHOGRAPHY MASK TECHNOLOGY XIV, PTS 1 AND 2, 2007, 6607 : G6071 - G6071
- [10] Programmed defects study on masks for 45nm immersion lithography using the novel AIMS™45-193i EMLC 2007: 23RD EUROPEAN MASK AND LITHOGRAPHY CONFERENCE, 2007, 6533