A new physics-based model for time-dependent-dielectric-breakdown

被引：0
|
作者：
Schlund, B [1 ]
Messick, C [1 ]
Suehle, JS [1 ]
Chaparala, P [1 ]
机构：
[1] MOTOROLA INC,SCOTTSDALE,AZ 85252
来源：
1996 IEEE INTERNATIONAL RELIABILITY PHYSICS PROCEEDINGS, 34TH ANNUAL | 1996年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：84 / 92
页数：3
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