Measurement of residual stress by using focused ion beam and digital image correlation method in thin-sized wires used for steel cords

被引：2
|
作者：
Yang, Y. S. [1 ,2 ]
Bae, J. G. [3 ]
Park, C. G. [1 ,2 ]
机构：
[1] POSTECH, Dept Mat Sci & Engn, Pohang, South Korea
[2] POSTECH, Natl Ctr Nanomat Technol, Pohang, South Korea
[3] KISWIRE R&D, Pohang, South Korea
来源：
PROCEEDINGS OF THE 17TH INTERNATIONAL VACUUM CONGRESS/13TH INTERNATIONAL CONFERENCE ON SURFACE SCIENCE/INTERNATIONAL CONFERENCE ON NANOSCIENCE AND TECHNOLOGY | 2008年 / 100卷
关键词：
D O I：
10.1088/1742-6596/100/1/012018
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Residual stress in the axial direction of the steel wires has been measured by using a method based on the combination of the focused ion beam (FIB) milling and digital image correlation software. That is, the residual stress was calculated from the measured displacement field before and after the introduction of a slot along the steel wires. The displacement was obtained by the digital correlation analysis of high-resolution scanning electron micrographs, while the slot was introduced by FIB milling with low energy beam. The fitting of the experimental results to an analytical model with the independent Young's modulus determined allows us to find the residual stress. The complete experimental procedures are described and its feasibilities are also evaluated for the thin-sized steel wires.
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页数：4
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