RBS study of epitaxially grown thin films of the double perovskite La2NiMnO6

被引：8

作者：

Budak, S.

Muntele, C.

Muntele, I.

Guo, H.

Gupta, A.

Ila, D. ^{[1
]}

机构：

[1] Alabama A&M Univ, Dept Phys, Ctr Irradiat Mat, Normal, AL 35762 USA

[2] Univ Alabama, Ctr Mat Informat Technol, Tuscaloosa, AL 35487 USA

[3] Univ Alabama, Dept Chem, Tuscaloosa, AL 35487 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2007年 / 261卷 / 1-2期

基金：

美国国家科学基金会;

关键词：

multiferroics; ordered double perovskite; PLD; thermoelectric (Peltier) coolers; rutherford backscattering spectrometry (RBS);

D O I：

10.1016/j.nimb.2007.04.166

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Epitaxial thin films of La2NiMnO6, a ferromagnetic semiconductor, have been fabricated on different substrates by pulsed laser deposition (PLD) [H. Guo, J. Burgess, S. Street, A. Gupta, T.G. Calvarese, M.A. Subramanian, Appl. Phys. Lett. 89 (2006) 0225509]. X-ray diffraction and Raman scattering observations show that the films are single crystalline and have an orthorhombic structure. Rutherford backscattering spectrometry (RBS) measurements were done on four different samples using 2.1 MeV He+ ions. We used RUMP simulation on the RBS data to extract information about the thickness and stoichiometry of the layers. In this paper, we are discussing the differences of the various films investigated. (c) 2007 Elsevier B.V. All rights reserved.

引用

页码：686 / 689

页数：4

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