Qualification tests and reliability analysis on electronic ballast system

被引：0
|
作者：
Catelani, Marcantonio [1 ]
Zanobini, Andrea [1 ]
Ciani, Lorenzo [1 ]
Corsini, Francesco [1 ]
机构：
[1] Univ Florence, Dept Elect & Telecommun, I-50139 Florence, Italy
来源：
I2MTC: 2009 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3 | 2009年
关键词：
reliability analysis; life test; electronic ballast system; thermal tests; on/off tests; emc tests;
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The paper presents results obtained by qualification tests implemented on an electronic ballast, with particular attention to ON/OFF and thermal tests and EMC tests. Being the device under test an innovative electronic power supply system designed for application in energy saving, it's fundamental also an evaluation and analysis of the reliability performances. To this aim some results obtained with reliability prediction method are also presented in the paper.
引用
收藏
页码：1660 / 1663
页数：4
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