Detecting tiny defects

被引：0
|
作者：
Cederquist, SC
机构：
来源：
MATERIALS PERFORMANCE | 2000年 / 39卷 / 02期
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D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
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页码：80 / 80
页数：1
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