Raman spectroscopy for the investigation of indentation-induced domain texturing in lead zirconate titanate piezoceramics

被引：16

作者：

Deluca, Marco ^{[1
,2
]}

Bermejo, Raul ^{[1
]}

Gruenbichler, Hannes ^{[1
,2
]}

Presser, Volker ^{[3
]}

Danzer, Robert ^{[1
,2
]}

Nickel, Klaus G. ^{[4
]}

机构：

[1] Univ Leoben, Inst Strukt & Funkt Keram, A-8700 Leoben, Austria

[2] Mat Ctr Leoben Forsch GmbH, A-8700 Leoben, Austria

[3] Drexel Univ, AJ Drexel Nanotechnol Inst, Philadelphia, PA 19104 USA

[4] Univ Tubingen, Inst Geosci, D-72074 Tubingen, Germany

来源：

SCRIPTA MATERIALIA | 2010年 / 63卷 / 03期

关键词：

Perovskites; PZT; Raman spectroscopy; Micro-indentation; FRACTURE-TOUGHNESS; ELECTRIC-FIELD; R-CURVE; CERAMICS; BEHAVIOR; ORIENTATION;

D O I：

10.1016/j.scriptamat.2010.04.040

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The study of the close relationship between crack propagation and domain switching is of extreme importance in the reliability of PbZr1-xTixO3 (PZT) devices. We performed domain imaging in the neighbourhood of indentation cracks on poled and non-poled PZT bulk specimens using polarized micro-Raman spectroscopy. Non-destructive Raman measurements helped to correlate the indentation-induced domain texture with the crack growth resistance on both samples. Hence, polarized micro-Raman spectroscopy offers the potential to locally investigate regions of interest in complex piezoelectric devices. (C) 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：343 / 346

页数：4

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