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Additive mechanism investigation of perfluoropolyether lubricants with a phosphazene additive
被引:5
|作者:
Jiaa, CL
[1
]
Liu, YM
[1
]
Gao, C
[1
]
机构:
[1] StorMedia Inc, Santa Clara, CA 95050 USA
关键词:
lubricants;
additives;
Secondary Ion Mass Spectroscopy;
(SIMS);
Fourier Transform Infrared Spectroscopy (FTIR);
hard disks;
tribology;
D O I:
10.1080/10402000008982392
中图分类号:
TH [机械、仪表工业];
学科分类号:
0802 ;
摘要:
The tribological characteristics of magnetic thin film media coated with perfluoropolyether (PFPE) lubricants (ZDOL and AM3001) and a phosphazene additive (X-1P) were investigated in this study. The drag test results show that under ambient and hot/wet conditions the media coated with AM3001 lubricant have higher retention on the test track than those coated with ZDOL 2000 PFPE lubricant. The phosphazene additive X-1P was observed to strongly anchored to the surface and was not as easily removed as PFPE lubricants alone. The retention characteristics of X-1P are independent of either AM or ZDOL. Secondary Ion Mass Spectroscopy (SIMS) depth profile data and Angle-Resolved X-Ray Photo-electron Spectroscopy (XPS) reveal that X-1P molecules were distributed near the disk surface in the X-1P and PFPE lubricants mixed layer, indicating a strong bonding/adhesion of X-1P to the disk surface. Together with the drag testing data, the authors conclude that the preferential distribution of X-1P close to the disk surface in the mixed layer helps to improve lubricant retention performance at the head-disk interface.
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页码:659 / 664
页数:6
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