Examination of through-thickness/through-time phase evolution during an MOD-type REBCO precursor conversion using Raman microscopy

被引:9
|
作者
Chen, Z. [1 ]
Maroni, V. A. [1 ]
Miller, D. J. [1 ]
Li, X. [2 ]
Rupich, M. W. [2 ]
Feenstra, R. [3 ]
机构
[1] Argonne Natl Lab, Argonne, IL 60439 USA
[2] Amer Superconductor Corp, Devens, MA 01434 USA
[3] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA
来源
SUPERCONDUCTOR SCIENCE & TECHNOLOGY | 2010年 / 23卷 / 08期
关键词
METALORGANIC DEPOSITION; YBCO FILMS; MICROSTRUCTURE; RABITS;
D O I
10.1088/0953-2048/23/8/085006
中图分类号
O59 [应用物理学];
学科分类号
摘要
Through-thickness/through-time composition analyses were made on REBa(2)Cu(3)O(6+x) (REBCO) films prepared from metal-organic deposited (MOD) precursors on a RABiTS (rolling-assisted biaxially textured substrate) template. YDy(0.5)Ba(2)Cu(3)O(6+x) films were fabricated either by a single precursor coating or by two separate, equivalent precursor coatings with an intermediate decomposition. Specimens were quenched at selected times along a heat treatment profile that simulated conditions used by American Superconductor, then examined by Raman microscopy along mechanically milled slopes through the REBCO films. Upon reaching the reaction temperature T(R), the precursor initially transforms into a (Y, Dy)(2)Cu(2)O(5), CuO, Cu(2)O, and RE-Ba-F-O phase mix, and this is followed shortly by substrate level REBCO formation that propagates upwards through time. Our results indicate that (1) the single layer (SL) and double layer (DL) films (both similar to 1.2 mu m thick) react to completion at about the same rate and arrive at a similar final composition and (2) some residual Ba-Cu-O phases persist near the top of the fully reacted films. The performance of the SL film was moderately better than that of the DL film, seemingly due to better through-thickness REBCO texture as determined using x-ray diffraction.
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页数:9
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