A study on the short-wavelength and high-numerical-aperture phase-change recording

被引：0
|
作者：
Liu, B [1 ]
Ruan, H [1 ]
Gan, FX [1 ]
机构：
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Shanghai 201800, Peoples R China
来源：
CHINESE PHYSICS | 2003年 / 12卷 / 01期
关键词：
phase-change; short-wavelength; high numerical aperture; transmission-electron microscopy;
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
In this paper, we discuss the phase-change recording at a short-wavelength (514 nm) and a high numerical aperture (0.85). Effects of recording power and pulse width on the size of the recording marks are studied. The minimum recording mark with a length of approximately 220 nm has been observed. The capacity of about 17 GB for a single-layer disc of a 12 cm diameter can be obtained. The maximum carrier-to-noise ratio reaches 45 dB at a writing power of 13-14 mW.
引用
收藏
页码：107 / 111
页数：5
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