Influence of line defects on focusing in a two-dimensional photonic-crystal flat lens

被引:2
|
作者
Feng Zhi-Fang [1 ]
机构
[1] Beijing Univ Chem Technol, Beijing 100029, Peoples R China
基金
中国国家自然科学基金;
关键词
flat lens; line defect; photonic crystal; NEGATIVE REFRACTION;
D O I
10.1088/1674-1056/19/6/067201
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We investigate in detail the influence of line defects on focusing of electromagnetic waves in a two-dimensional photonic-crystal flat lens. Through simulations, we find that a focusing can always be observed when a line defect in the lens is introduced along the light transmission direction and the width of the line defect is less than lambda/2. However, there appear two focusings when the width of the line defect is more than lambda/2. When the line defect is introduced along the direction perpendicular to the transmission, there is always one focusing.
引用
收藏
页数:4
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