Electromagnetic wake-field due to wall roughness in an optical structure

被引：0

作者：

Banna, S ^{[1
]}

Schächter, L ^{[1
]}

Schieber, D ^{[1
]}

机构：

[1] Technion Israel Inst Technol, Dept Elect Engn, IL-32000 Haifa, Israel

来源：

ADVANCED ACCELERATOR CONCEPTS | 2004年 / 737卷

关键词：

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The effect of the surface roughness on a moving electron bunch is considered by resorting to a model of a metallic structure with random perturbations on its surface. Based upon this model, analytic expressions have been derived for the average enemy emitted per groove (EPG) and for its standard deviation. For a relativistic bunch, both quantities are shown to be virtually independent of the momentum. Moreover, it has been found that the standard deviation of the EPG is proportional to that of the roughness parameter to the power of 1/4.

引用

页码：743 / 749

页数：7

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