Localized ferromagnetic resonance in inhomogeneous thin films

被引:194
|
作者
McMichael, RD [1 ]
Twisselmann, DJ
Kunz, A
机构
[1] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
[2] Lawrence Univ, Dept Phys, Appleton, WI 54912 USA
关键词
D O I
10.1103/PhysRevLett.90.227601
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The effect of sample inhomogeneity on the ferromagnetic resonance linewidth is determined by diagonalization of a spin wave Hamiltonian for ferromagnetic thin films with inhomogeneities spanning a wide range of characteristic length scales. A model inhomogeneity is used that consists of size D grains and an anisotropy field H-p that varies randomly from grain to grain in a film with thickness d and magnetization M-s. The resulting linewidth agrees well with the two-magnon model for small inhomogeneity, HpD<piM(s)d. For large inhomogeneity, HpD>piM(s)d, the precession becomes localized and the spectrum approaches that of local precession on independent grains.
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页数:4
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