Redundancy - It's not just for defects anymore

被引：2
|
作者：
Aitken, R [1 ]
机构：
[1] Artisan Corp, Sunnyvale, CA 94089 USA
来源：
RECORDS OF THE 2004 IEEE INTERNATIONAL WORKSHOP ON MEMORY TECHNOLOGY, DESIGN AND TESTING | 2004年
关键词：
D O I：
10.1109/MTDT.2004.1327994
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
This paper shows how process variation affects memory margin and performance, and shows that in some cases additional redundancy capability can be used to recover yield due to process variation in addition to yield recovery for defects.
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页码：117 / 120
页数：4
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