A simulation of the flight experience of the ACIS CCDs on the Chandra X-ray Observatory

被引：3

作者：

Hill, JE ^{[1
]}

Lewis, KT ^{[1
]}

Foster, RF ^{[1
]}

Bautz, M ^{[1
]}

Brown, SK ^{[1
]}

Roming, PWA ^{[1
]}

Hornschemeier, AE ^{[1
]}

Burrows, DN ^{[1
]}

Garmire, GP ^{[1
]}

机构：

[1] Penn State Univ, Dept Astron & Astrophys, University Pk, PA 16802 USA

来源：

X-RAY OPTICS, INSTRUMENTS, AND MISSIONS III | 2000年 / 4012卷

关键词：

charge coupled device; X-rays; charge transfer efficiency;

D O I：

10.1117/12.391577

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

The energy resolution degradation of the ACIS CCDs on board the Chandra X-ray Observatory (CXO) has been under investigation since the effect was first recognised two months after launch. A series of laboratory CCD irradiations with electrons and protons have taken place, leading to the belief that low energy protons are responsible for the damage. In order to confirm this, an experiment has been devised to represent the flight experience of the ACIS CCDs, and the results to date are shown here.

引用

页码：402 / 413

页数：12

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