The Models and Formal System of Energy-Reliability Optimization

the global trend in green computing has led to new reliability techniques that focus on reducing energy consumption. One such method is transistor level redundancy. However, in order to improve reliability, it is primarily necessary to ensure the required level of reliability, and developers often need to ensure high device performance. Therefore, optimization tasks appear. The work proposes a formal output system of the protected sub-circuit, which allows you to allocate sections of the circuit that are optimal for protection by a certain method. The effectiveness of the formal output system is assessed using a number of numerical experiments.