Microstructural comparison between melt processed, in-situ processed and sintered Tl(Bi)-1223/Ag tapes using TEM.

被引：1
|
作者：
Eastell, CJ [1 ]
Moore, JC [1 ]
Fox, S [1 ]
Grovenor, CRM [1 ]
Goringe, MJ [1 ]
机构：
[1] Univ Oxford, Dept Mat, Oxford OX1 3PH, England
来源：
JOURNAL OF SUPERCONDUCTIVITY | 1998年 / 11卷 / 01期
基金：
英国工程与自然科学研究理事会;
关键词：
Tl-1223; microstructure; TEM; PIT; processing;
D O I：
10.1023/A:1022648905495
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have compared the microstructure of sintered, in-situ and melt processed Tl(Bi)-1223/Ag tapes using TEM. Melt processing of the tapes increases grain connectivity and removes amorphous phases leading to an improvement in the I-c/B characteristics of the material. No long range grain alignment, which is the main requirement for improving the properties; was observed in the tapes.
引用
收藏
页码：11 / 12
页数：2
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