CR-39 sensitivity analysis on heavy ion beam with atomic force microscope

被引：24

作者：

Yamamoto, M

Yasuda, N

Kaizuka, Y

Yamagishi, M

Kanai, T

Ishigure, N

Furukawa, A

Kurano, M

Miyahara, N

Nakazawa, M

Doke, T

Ogura, K

机构：

[1] Natl Inst Radiol Sci, Inage Ku, Chiba 263, Japan

[2] Toho Univ, Dept Phys, Funabashi, Chiba 274, Japan

[3] Univ Tokyo, Grad Sch Engn, Bunkyo Ku, Tokyo 113, Japan

[4] Waseda Univ, Adv Res Ctr Sci & Engn, Shinjuku Ku, Tokyo 162, Japan

[5] Nihon Univ, Coll Ind Technol, Narashino, Chiba 275, Japan

来源：

RADIATION MEASUREMENTS | 1997年 / 28卷 / 1-6期

关键词：

AFM (Atomic Force Microscope); nuclear track detector; CR-39; sensitivity; heavy ion cancer treatment;

D O I：

10.1016/S1350-4487(97)00073-5

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

Preliminary results of feasibility study to apply atomic force microscope (AFM) to the quantitative analysis for minute etch pits on CR-39 are reported comparing with the optical microscope observation. The growth curves of the Si track diameter and length obtained by both techniques were discussed in relation to the track sensitivity and the etch induction time.

引用

页码：227 / 230

页数：4

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