In-situ characterization of the carbon nanotube growth process by X-ray diffraction

被引：0
|
作者：
Baehtz, Carsten [1 ]
Wirth, C. Tobias [2 ]
Bayer, Bernhard C. [2 ]
Hofmann, Stephan [2 ]
von Borany, Johannes [1 ]
机构：
[1] Helmholtz Zentrum Dresden Rossendorf, Inst Ion Beam Phys & Mat Res, Dresden, Germany
[2] Univ Cambridge, Dept Engn, Cambridge CB3 0FA, England
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2011年 / 67卷
关键词：
carbon nanotubes; in-situ diffraction; synchrotron radiation;
D O I：
10.1107/S010876731109698X
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS.52.5
引用
收藏
页码：C123 / C124
页数：2
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