Two-dimensional scaling of resistance in flux flow region in Tl2Ba2CaCu2O8 thin films

The resistance of Tl2Ba2CaCu2O8 thin films has been measured when the angle between the applied fields and ab-plane of the film is changed continuously at various temperatures. Under various magnetic fields, the resistance can be well scaled in terms of the c-axis component of the applied fields at the same temperature in the whole angle range. Meanwhile, we show that the measurement of resistance in this way is a complementary method to determine the growth orientation of the anisotropic high-T-c superconductors. (C) 2004 Elsevier B.V. All rights reserved.