Fast fault simulation for nonlinear analog circuits

被引：4
|
作者：
Engin, N
Kerkhoff, HG
机构：
[1] Philips Res Labs, NL-5656 AA Eindhoven, Netherlands
[2] MESA & Res Inst, Testable Design & Testing Microsyst Grp, Enschede, Netherlands
[3] Univ Twente, Fac Elect Engn, Enschede, Netherlands
来源：
IEEE DESIGN & TEST OF COMPUTERS | 2003年 / 20卷 / 02期
关键词：
D O I：
10.1109/MDT.2003.1188261
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
A new method of transient fault simulation uses dc bias grouping of faulty circuits and decreases the number of Newton-Raphson iterations needed to reach a solution. An experimental tool implementing this method achieves a speedup of 20% to 30% on a flat netlist.
引用
下载
收藏
页码：40 / 47
页数：8
相关论文
共 50 条
  • [1] Efficient DC fault simulation of nonlinear analog circuits
    Tian, MW
    Shi, CJR
    DESIGN, AUTOMATION AND TEST IN EUROPE, PROCEEDINGS, 1998, : 899 - 904
  • [2] FAULT SIMULATION OF LINEAR ANALOG CIRCUITS
    NAGI, N
    CHATTERJEE, A
    ABRAHAM, JA
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 1993, 4 (03) : 245 - 260
  • [3] Fast, robust DC and transient fault simulation for nonlinear analogue circuits
    Yang, ZR
    Zwolinski, M
    DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS, 1999, : 244 - 248
  • [4] Concurrent transient fault simulation for analog circuits
    Hou, JW
    Chatterjee, A
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2003, 22 (10) : 1385 - 1398
  • [5] State estimation and fault diagnosis for nonlinear analog circuits
    Ma Hong-guang
    Li Geng
    Han Chong-zhao
    2006 INTERNATIONAL CONFERENCE ON COMMUNICATIONS, CIRCUITS AND SYSTEMS PROCEEDINGS, VOLS 1-4: VOL 1: SIGNAL PROCESSING, 2006, : 266 - +
  • [6] New Aspects of Fault Diagnosis of Nonlinear Analog Circuits
    Tadeusiewicz, Michal
    Halgas, Stanislaw
    Kuczynski, Andrzej
    INTERNATIONAL JOURNAL OF ELECTRONICS AND TELECOMMUNICATIONS, 2015, 61 (01) : 83 - 93
  • [7] SIMULATION METHODS OF MICROWAVE NONLINEAR ANALOG CIRCUITS
    QUERE, R
    NGOYA, E
    GAYRAL, M
    PRIGENT, M
    ROUSSET, J
    ANNALES DES TELECOMMUNICATIONS-ANNALS OF TELECOMMUNICATIONS, 1990, 45 (3-4): : 113 - 126
  • [8] Fault simulation for analog circuits under parameter variations
    Khouas, A
    Derieux, A
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2000, 16 (03): : 269 - 278
  • [9] Fault Simulation for Analog Circuits Under Parameter Variations
    Abdelhakim Khouas
    Anne Derieux
    Journal of Electronic Testing, 2000, 16 : 269 - 278
  • [10] Efficient DC fault simulation of nonlinear analog circuits: One-step relaxation and adaptive simulation continuation
    Shi, C. -J. Richard
    Tian, Michael W.
    Shi, Guoyong
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2006, 25 (07) : 1392 - 1400
12345