In situ Ru LII and LIII-edge X-ray absorption near edge structure of electrodeposited ruthenium dioxide films

被引：0
|
作者：
Stefan, IC [1 ]
Mo, YB [1 ]
Antonio, MR [1 ]
Scherson, DA [1 ]
机构：
[1] Case Western Reserve Univ, Dept Chem, Cleveland, OH 44106 USA
来源：
ELECTROCHEMICAL CAPACITOR AND HYBRID POWER SOURCES | 2002年 / 2002卷 / 07期
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D O I：
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中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
The electronic properties of electrodeposited Ru oxide films supported on Au have been examined in situ by Ru L-III and L-II-edge X-ray absorption near edge structure (XANES) in acid media. The results obtained are consistent with the main voltammetric peak centered at 0.7 V vs RHE as being attributed to a redox couple involving formally Ru3+ and Ru4+ sites in the lattice. A linear correlation was found between the extent of oxidation of the film as derived from a deconvolution of the spectral features and the charge as determined from coulometric analysis of the voltammetric curves. This observation suggests that only two Ru-based redox states are involved in this electrochemical process.
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页码：291 / 296
页数：6
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