A Two-Scale Microfacet Reflectance Model Combining Reflection and Diffraction

被引:76
|
作者
Holzschuch, Nicolas [1 ]
Pacanowski, Romain [2 ]
机构
[1] Univ Grenoble Alpes, INRIA, CNRS, LJK, Grenoble, France
[2] Univ Bordeaux, Grad Sch, Inst Opt, CNRS, Bordeaux, France
来源
ACM TRANSACTIONS ON GRAPHICS | 2017年 / 36卷 / 04期
关键词
material models; BRDF; diffraction;
D O I
10.1145/3072959.3073621
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Adequate reflectance models are essential for the production of photorealistic images. Microfacet reflectance models predict the appearance of a material at the macroscopic level based on microscopic surface details. They provide a good match with measured reflectance in some cases, but not always. This discrepancy between the behavior predicted by microfacet models and the observed behavior has puzzled researchers for a long time. In this paper, we show that diffraction effects in the micro-geometry provide a plausible explanation. We describe a two-scale reflectance model, separating between geometry details much larger than wavelength and those of size comparable to wavelength. The former model results in the standard Cook-Torrance model. The latter model is responsible for diffraction effects. Diffraction effects at the smaller scale are convolved by the micro-geometry normal distribution. The resulting two-scale model provides a very good approximation to measured reflectances.
引用
收藏
页数:12
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