CORRELATING OP-AMP CIRCUIT NOISE WITH DEVICE FLICKER (1/f) NOISE FOR ANALOG DESIGN APPLICATIONS

被引：0

作者：

Srinivasan, P. ^{[1
]}

Marshall, A. ^{[1
]}

机构：

[1] Texas Instruments Inc, Technol Design Integrat, Dallas, TX 75243 USA

来源：

IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS | 2009年

关键词：

D O I：

10.1109/SOCCON.2009.5398062

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Component noise is becoming more of an issue as device sizes reduce. Using a 45nm CMOS process we evaluate a method to correlate noise in operational amplifiers with transistor noise at low-frequencies. This reduces test time, and provides an alternative method to characterize and model 1/f noise of individual devices.

引用

页码：191 / 194

页数：4

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