Automated Configuration of Modern ATE

被引:0
|
作者
Headrick, William J. [1 ,2 ]
Garcia, Gilberto [3 ]
机构
[1] Lockheed Martin Rotary & Mission Syst, Orlando, FL 32825 USA
[2] Harris Corp, Melbourne, FL 32919 USA
[3] ISSC, Fleet Readiness Ctr Southeast FRCSE, Jacksonville, FL USA
关键词
D O I
10.1109/MIM.2018.8423742
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Modern Automatic Test Equipment (ATE) must perform many tasks to support testing of devices. The devices being tested may be anything from simple circuit cards to complex multi-device systems. In addition, they may employ analog, digital and / or radio frequency testing. This, coupled with the desire to test the devices as quickly as possible, can drive ATE systems to employ multiple systems with their own associated computers in order to perform complex testing in as short a time as possible. Another requirement of modern ATE is that they are able to be quickly repaired and be able to be configured quickly to perform their intended function. Since the platforms on which the tested equipment is installed cannot be used unless they are completely operational, the ATE used to test that equipment must be available to perform the testing. Additionally, it is often intended that the testing and repair tasks be performed by non-technical or semi-technical individuals. It is this last capability that can drive the desire to support the ability to perform automated installation and configuration of the ATE systems. © 2018 IEEE.
引用
收藏
页码:22 / 26
页数:5
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