Bayesian Surprise and Landmark Detection

被引:0
|
作者
Ranganathan, Ananth [1 ]
Dellaert, Frank [2 ]
机构
[1] Honda Res Inst, Cambridge, MA 94043 USA
[2] Georgia Inst Technol, Coll Comp, Atlanta, GA 30332 USA
关键词
SIMULTANEOUS LOCALIZATION;
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Automatic detection of landmarks, usually special places in the environment such as gateways, for topological mapping has proven to be a difficult task. We present the use of Bayesian surprise, introduced in computer vision, for landmark detection. Further, we provide a novel hierarchical, graphical model for the appearance of a place and use this model to perform surprise-based landmark detection. Our scheme is agnostic to the sensor type, and we demonstrate this by implementing a simple laser model for computing surprise. We evaluate our landmark detector using appearance and laser measurements in the context of a topological mapping algorithm, thus demonstrating the practical applicability of the detector.
引用
收藏
页码:1240 / +
页数:2
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