Ions confinement in electron beam ion trap

被引:0
|
作者
Liu, MH
Wang, SC
Hu, XW
机构
来源
关键词
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
This paper shows the evolution of density and temperature of multi-charged ions in an electron beam ion trap (EBIT). Three cases are studied: the continuous neutral gas injection, ion source injection, and evaporative cooling. The effects of the neutral gas density, axial potential, and the beam current density on the ions evolution are discussed.
引用
收藏
页码:176 / 184
页数:9
相关论文
共 50 条
  • [1] Ions confinement in electron beam ion trap
    Acta Phys Sinica, 3 (176):
  • [2] Spectroscopic study of bismuth ions with an electron beam ion trap
    Ohashi, Hayato
    Sakaue, Hiroyuki A.
    Nakamura, Nobuyuki
    XXVIII INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC AND ATOMIC COLLISIONS (ICPEAC), 2014, 488
  • [3] CONFINEMENT OF INJECTED BEAM IONS IN A KINGDON TRAP
    YANG, LS
    CHURCH, DA
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1991, 56-7 : 1185 - 1187
  • [4] Extraction of trapped ions from the Tokyo Electron Beam Ion Trap
    Motohashi, K.
    Asada, J.
    Currell, F.J.
    Fukami, T.
    Hirayama, T.
    Mochiji, K.
    Nakamura, N.
    Nojikawa, E.
    Okazaki, K.
    Ohtani, S.
    Sakurai, M.
    Shiraishi, H.
    Tsurubuchi, S.
    Watanabe, H.
    1997, Royal Swedish Acad of Sciences, Stockholm, Sweden (T73):
  • [5] Extraction of trapped ions from the Tokyo Electron Beam Ion Trap
    Motohashi, K
    Asada, J
    Currell, FJ
    Fukami, T
    Hirayama, T
    Mochiji, K
    Nakamura, N
    Nojikawa, E
    Okazaki, K
    Ohtani, S
    Sakurai, M
    Shiraishi, H
    Tsurubuchi, S
    Watanabe, H
    PHYSICA SCRIPTA, 1997, T73 : 368 - 370
  • [6] Study of Ar ions Κβ profile with the help of an electron beam ion trap
    Antsiferov, PS
    Churilov, SS
    PHYSICA SCRIPTA, 2001, 64 (04): : 292 - 294
  • [7] Direct imaging of highly charged ions in an electron beam ion trap
    Porto, JV
    Kink, I
    Gillaspy, JD
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (08): : 3050 - 3058
  • [8] Highly charged ions produced in a warm electron beam ion trap
    Ovsyannikov, VP
    Zschornack, G
    Grossmann, F
    Landgraf, S
    Ullmann, F
    Werner, T
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (02): : 690 - 692
  • [9] Electron beam ion source and electron beam ion trap (invited)
    Becker, Reinard
    Kester, Oliver
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2010, 81 (02):
  • [10] CONFINEMENT OF IONS CREATED EXTERNALLY IN A PENNING ION TRAP
    O, CS
    SHUESSLER, HA
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1981, 39 (01): : 95 - 103