THz-Field-Driven Electron Tunneling on the Nanoscale

被引:0
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作者
Takeda, Jun [1 ]
Yoshioka, Katsumasa [1 ]
Minami, Yasuo [1 ,2 ]
Arashida, Yusuke [1 ]
Katayama, Ikufumi [1 ]
机构
[1] Yokohama Natl Univ, Yokohama, Kanagawa 2408501, Japan
[2] Tokushima Univ, Tokushima 7708506, Japan
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TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Improved control over the electromagnetic properties of metallic systems on the nanoscale is a key issue fir the development of next-generation nanoelectronics. Here, we demonstrate that intense terahertz (THz) electric fields can manipulate the electron delocalization in ultrathin gold (Au) films with nanostructures; the ultrafast electron delocalization takes place through electron tunneling across the narrow insulating bridge between the Au nanostructures. For further manipulating the THz-field-drive n electron tunneling, phase-controlled single-cycle THz near fields have been utilized in a tunnel junction via THz scanning tunneling microscopy (THz-STM). This new technique allows us to unprecedented control of electrons sub-picosecond electron burst can he produced in a single tunnel junction with desirable direction and numbers.
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