M-shell X-ray production cross sections of Bi induced by highly charged F ions

被引：7

作者：

Singh, Y ^{[1
]}

Tribedi, LC ^{[1
]}

机构：

[1] Tata Inst Fundamental Res, Bombay 400005, Maharashtra, India

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2003年 / 205卷

关键词：

ionization; inner shell; M-subshells; X-ray; fluorescence yield;

D O I：

10.1016/S0168-583X(03)00590-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

NI-shell X-ray production cross sections are reported for Bi induced by F ions in the energy range of 20-102 MeV. For a comparative study we have also used p, He, Li and C ions as projectiles at a few energies. The absolute X-ray cross sections for M-alphabeta, M-gamma lines and the total cross sections are derived. The intensity ratios, I(gamma)/I(alphabeta), of the M-gamma and M-alphabeta, and their energy shifts signifying the multiple vacancies in outer shells have also been studied. The measured cross sections are compared with the ECPSSR calculations. In case of M-gamma, the cross sections are found to be much higher than the ECPSSR predictions which is attributed to a net enhancement in the M-3-subshell fluorescence yield due to multiple vacancies in the N-subshells. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：794 / 798

页数：5

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