Characterization of a polycapillary focusing X-ray lens for application in spatially resolved EXAFS experiments

被引:15
|
作者
Sun, Tianxi
Liu, Zhiguo
Ding, Xunliang [1 ]
机构
[1] Beijing Normal Univ, Minist Educ, Key Lab Beam Technol & Mat Modificat, Beijing 100875, Peoples R China
[2] Beijing Normal Univ, Inst Low Energy Nucl Phys, Beijing 100875, Peoples R China
[3] Beijing Radiat Ctr, Beijing 100875, Peoples R China
关键词
D O I
10.1016/j.cplett.2007.03.105
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A dispersive extended-X-ray-absorption-fine-structure (EXAFS) spectrometer based on a polycapillary focusing X-ray lens (PFXRL), a position-sensitive proportional counter and a rotating anode X-ray source is designed. When the working voltage and current of a Mo rotating anode X-ray generator are 25 kV and 100 mA, respectively, it takes 6 h to obtain the EXAFS spectrum of the Cu film. The experiments show that a dispersive EXAFS spectrometer based on a PFXRL can be applied in spatially resolved EXAFS analysis. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:412 / 414
页数:3
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