Ultrafast Terahertz Nanoseismology of GaInN/GaN Multiple Quantum Wells

被引:8
|
作者
Mannan, Abdul [1 ]
Bagsican, Filchito Renee G. [1 ]
Yamahara, Kota [1 ]
Kawayama, Iwao [1 ,2 ]
Murakami, Hironaru [1 ]
Bremers, Heiko [3 ]
Rossow, Uwe [3 ]
Hangleiter, Andreas [3 ]
Turchinovich, Dmitry [4 ]
Tonouchi, Masayoshi [1 ]
机构
[1] Osaka Univ, Inst Laser Engn, Yamadaoka 2-6, Suita, Osaka 5650871, Japan
[2] Kyoto Univ, Inst Energy Engn, Kyoto, Japan
[3] Tech Univ Carolo Wilhelmina Braunschweig, Inst Appl Phys, Mendelssohnstr 2, D-38106 Braunschweig, Germany
[4] Univ Bielefeld, Fak Phys, D-33615 Bielefeld, Germany
关键词
coherent acoustic phonons; dynamical screening; GaIn; GaN quantum wells; inverse piezoelectric effect; laser terahertz emission microscopy; nanoseismology; terahertz emission;
D O I
10.1002/adom.202100258
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Terahertz (THz) emission spectroscopy and microscopy are applied to investigate the electron and lattice dynamics of Ga0.8In0.2N/GaN multiple quantum wells (MQWs). The THz emission consists of three distinct, differently timed signals, whose physical mechanisms are attributed to i) laser-induced ultrafast dynamical screening of built-in bias electric field in MQWs followed by ii) capacitive charge oscillation of the excited carriers and iii) the coherent acoustic phonon (CAP)-driven polarization surge at the discontinuity between the GaN capping layer and air. These multifunctional optical responses show strong dependence on the quantum well width and photon energies. The temporal separation between the first and third THz pulses corresponds to the propagation of the CAP across the GaN capping layer of the MQW structure, whose thickness can thus be determined with 10 nm precision.
引用
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页数:8
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