Detection of various defects in TFT-LCD polarizing film

被引：0
|
作者：
Sohn, Sang-Wook [1 ]
Lee, Dae-Young
Choi, Hun [2 ]
Suh, Jae-Won [3 ]
Bae, Hyeon-Dok [1 ]
机构：
[1] Chungbuk Natl Univ, Dept Elect Engn, Cheongju, South Korea
[2] KRISS, Seoul, South Korea
[3] Chungbuk Natl Univ, Dept Elect Engn, Chungbuk, South Korea
来源：
ADAPTIVE AND NATURAL COMPUTING ALGORITHMS, PT 2 | 2007年 / 4432卷
关键词：
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
The increasing use of TFT-LCDs has generated a great deal of interest in manufacturing defects on TFT-LCD polarizing film because the poor quality of TFT-LCD polarizing film result in undesirable effects on the TFT-LCD display devices. In this paper, we propose a new inspection method that reliably detects various defects of TFT-LCD polarizing films. First, we apply a least mean squares adaptive filtering technique to remove background noise. Next, we use statistical characteristics to detect possible defects. Finally, we make a binary image to identify weather the TFT-LCD polarizing film has defects or not based on an adaptive threshold value. The performance of the proposed method has been evaluated on real TFT-LCD polarizing film samples.
引用
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页码：534 / +
页数：3
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