Empirically generated metric spaces for ATR in clutter

被引:0
|
作者
Bitouk, D [1 ]
Miller, MI [1 ]
Younes, L [1 ]
机构
[1] Johns Hopkins Univ, Ctr Imaging Sci, Baltimore, MD 21218 USA
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中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
One of the central problems in Automated Target Recognition is to accommodate the infinite variety of clutter in real military environments. The principle focus of our paper is to construct metric space where the metric measures the distance between objects of interest invariant to to the infinite variety of clutter. Such metrics are formulated using second-order random field models.
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页码:1407 / 1410
页数:4
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