Gas phase reactions between SiH4 and B2H6:: A theoretical study

被引:14
|
作者
Hu, SW [1 ]
Wang, Y [1 ]
Wang, XY [1 ]
机构
[1] Peking Univ, Coll Chem & Mol Engn, Dept Appl Chem, Beijing 100871, Peoples R China
来源
JOURNAL OF PHYSICAL CHEMISTRY A | 2003年 / 107卷 / 10期
关键词
D O I
10.1021/jp027113k
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Gas-phase reactions of silane (SiH4) and diborane (B2H6) are investigated using ab initio calculations at the MP2/6-311++g** level. Initially SiH4 and B2H6 are only weakly attracted to each other. Under thermal activation, the two molecules can overcome an energy barrier of 33.87 kcal/mol to associate into a complex SiH4-BH3-BH3 with a hydrogen-bridged Si-H-B bond. Upon bonding, one of the two hydrogen-bridged bonds B-H-B in B2H6 is broken and the other becomes polarized. Started from the SiH4-BH3-BH3 complex, three comparable fragmentation pathways involving BH3 and H-2 elimination produce several silaboranes with various silicon-boron-hydrogen ratios. A much higher barrier exists between the initial loosely bonded SiH4-B2H6 system and a direct H-2 elimination product SiH3-B2H5 with C-s symmetry. The bonding nature in, the species are further elucidated through topological analysis of electron density using the AIM theory. These intermediate silaboranes are possible precursors for chemical vapor deposition in fabricating boron doped silicon films. Their composition and polarity may determine their tendency of surface adsorption and the properties of the relevant solid. The proposed mechanisms can help to understand and control the initial gas-phase reactions in practice. Calculated IR spectra, dipole moment, and rotational constants of the species are provided to facilitate experimental investigations.
引用
收藏
页码:1635 / 1640
页数:6
相关论文
共 50 条
  • [1] Effects of B2H6 pretreatment on ALD of W film using a sequential supply of WF6 and SiH4
    Kim, SH
    Hwang, ES
    Kim, BM
    Lee, JW
    Sun, HJ
    Hong, TE
    Kim, JK
    Sohn, H
    Kim, J
    Yoon, TS
    ELECTROCHEMICAL AND SOLID STATE LETTERS, 2005, 8 (10) : C155 - C159
  • [2] Gas-phase reaction pathways from SiH4 to Si2H6, Si2H4 and Si2H2:: A theoretical study
    Hu, SW
    Wang, Y
    Wang, XY
    Chu, TW
    Liu, XQ
    JOURNAL OF PHYSICAL CHEMISTRY A, 2003, 107 (16): : 2954 - 2963
  • [3] Preparation of Si-N-B films by CVD techniques: Effect of SiH4 addition to B2H6 and NH3 gas mixtures
    Essafti, A
    GomezAleixandre, C
    Albella, JM
    DIAMOND AND RELATED MATERIALS, 1996, 5 (3-5) : 580 - 583
  • [4] DEPOSITION OF DOPED POLYSILICON FILMS BY PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITION FROM ASH3/SIH4 OR B2H6/SIH4 MIXTURES
    HAJJAR, JJJ
    REIF, R
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1990, 137 (09) : 2888 - 2896
  • [5] EFFECTS OF SIH4, GEH4, AND B2H6 ON THE NUCLEATION AND DEPOSITION OF POLYCRYSTALLINE SI1-XGEX FILMS
    LIN, HC
    CHANG, CY
    CHEN, WH
    TSAI, WC
    CHANG, TC
    JUNG, TG
    LIN, HY
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1994, 141 (09) : 2559 - 2563
  • [6] A comparative physical analysis of tungsten deposition in contacts using pulsed nucleation layer process with SiH4 or B2H6
    Smith, SR
    Walgenwitz, BJ
    Bonnin, OJH
    Braspenning, RH
    ADVANCED METALLIZATION CONFERENCE 2003 (AMC 2003), 2004, : 367 - 371
  • [7] INSITU STUDY OF P-TYPE AMORPHOUS-SILICON GROWTH FROM B2H6 - SIH4 MIXTURES - SURFACE REACTIVITY AND INTERFACE EFFECTS
    COLLINS, RW
    APPLIED PHYSICS LETTERS, 1988, 53 (12) : 1086 - 1088
  • [8] RATE CONSTANTS FOR THE REACTIONS OF SIH AND SIH2 WITH SIH4 IN A LOW-PRESSURE SIH4 PLASMA
    NOMURA, H
    AKIMOTO, K
    KONO, A
    GOTO, T
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1995, 28 (09) : 1977 - 1982
  • [9] Computational study on SiH4 dissociation channels and H abstraction reactions
    Hayashi, Toshio
    Ishikawa, Kenji
    Sekine, Makoto
    Hori, Masaru
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2016, 55 (07)
  • [10] THEORETICAL-STUDY OF B2H-5(+), B2H-6(+), AND B2H6
    CURTISS, LA
    POPLE, JA
    JOURNAL OF CHEMICAL PHYSICS, 1988, 89 (08): : 4875 - 4879