Goodness-of-Fit Test for Mismatched Self-Exciting Processes

被引:0
|
作者
Wei, Song [1 ]
Zhu, Shixiang [1 ]
Zhang, Minghe [1 ]
Xie, Yao [1 ]
机构
[1] Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
关键词
POINT PROCESS MODELS; RESIDUAL ANALYSIS; ESTIMATORS; SPECTRA;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Recently there have been many research efforts in developing generative models for self-exciting point processes, partly due to their broad applicability for real-world applications. However, rarely can we quantify how well the generative model captures the nature or ground-truth since it is usually unknown. The challenge typically lies in the fact that the generative models typically provide, at most, good approximations to the ground-truth (e.g., through the rich representative power of neural networks), but they cannot be precisely the ground-truth. We thus cannot use the classic goodness-of-fit (GOF) test framework to evaluate their performance. In this paper, we develop a GOF test for generative models of self-exciting processes by making a new connection to this problem with the classical statistical theory of Quasi-maximum-likelihood estimator (QMLE). We present a non-parametric self-normalizing statistic for the GOF test: the Generalized Score (GS) statistics, and explicitly capture the model misspecification when establishing the asymptotic distribution of the GS statistic. Numerical simulation and real-data experiments validate our theory and demonstrate the proposed GS test's good performance.
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页数:11
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