Gene effects for maydis leaf blight (Drechslera maydis) resistance and grain yield in white maize (Zea mays)

A study was conducted during 1996-98 on the gene effect for maydis leaf blight (Drechslera maydis) disease resistance and grain yield in exotic and indigenous white maize grain (Zen mays L.) from line x tester analysis. The experiment was conducted under artificial inoculation conditions. Combining ability analysis revealed that non-additive genetic variances were more important in the expression of disease resistance and high grain yield. There was no similarity in ranking between per-se performance and its corresponding. sca effects of the crosses. In general. it was found that resistance level of the crosses to maydis leaf blight disease was increased where both the parents were having disease reaction resistant/least susceptible followed by resistant x susceptible irrespective of incidence of male parents. Lines L,, L-2, L-3 and tester T-1 were the best general combiners for disease resistance and high yield. L-2 x T-1 and L-3 x T-1 were the most desirable combinations having both high per-se performance and high sea effects for the traits under study.