Compression Stress-Strain Behavior of Sn-Ag-Cu Solders

被引:4
|
作者
Lopez, Edwin P. [1 ]
Vianco, Paul T. [1 ]
Rejent, Jerome A. [1 ]
George, Carly [1 ]
Kilgo, Alice [1 ]
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
关键词
Tin-silver copper solder (Sn-Ag-Cu); thermal mechanical fatigue; modeling; constitutive equation; yield stress; elastic modulus;
D O I
10.1007/s11664-009-0968-z
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
New Pb-free alloys that are variations of the Sn-Ag-Cu (SAC) ternary system, having reduced Ag content, are being developed to address the poor shock load survivability of current SAC305, SAC396, and SAC405 compositions. However, the thermal mechanical fatigue properties must be determined for the new alloys in order to develop constitutive models for predicting solder joint fatigue. A long-term study was initiated to investigate the time-independent (stress-strain) and time-dependent (creep) deformation properties of the alloy 98.5Sn-1.0Ag-0.5Cu (wt.% SAC105). The compression stress-strain properties, which are reported herein, were obtained for the solder in as-cast and aged conditions. The test temperatures were -25A degrees C, 25A degrees C, 75A degrees C, 125A degrees C, and 160A degrees C and the strain rates were 4.2 x 10(-5) s(-1) and 8.3 x 10(-4) s(-1). The SAC105 performance was compared with that of the 95.5Sn-3.9Ag-0.6Cu (SAC396) solder. Like the SAC396 solder, the SAC105 microstructure exhibited only small microstructural changes after deformation. The stress-strain curves showed work-hardening behavior that diminished with increased temperature to a degree that indicated dynamic recrystallization activity. The aging treatment had a small effect on the stress-strain curves, increasing the degree of work hardening. The yield stresses of SAC105 were significantly less than those of SAC396. The aging treatment caused a small drop in yield stress, as is observed with the SAC396 material. The static modulus values of SAC105 were lower than those of SAC396 and exhibited both temperature and aging treatment dependencies that differed from those of the SAC396 material. These trends clearly show that the stress-strain behavior of Sn-Ag-Cu solders is sensitive to the specific, individual composition.
引用
收藏
页码:97 / 104
页数:8
相关论文
共 50 条
  • [1] Compression Stress–Strain Behavior of Sn-Ag-Cu Solders
    Edwin P. Lopez
    Paul T. Vianco
    Jerome A. Rejent
    Carly George
    Alice Kilgo
    Journal of Electronic Materials, 2010, 39 : 97 - 104
  • [2] The compression stress-strain behavior of Sn-Ag-Cu solder
    Paul T. Vianco
    Jerome A. Rejent
    Joseph J. Martin
    JOM, 2003, 55 : 50 - 55
  • [3] The compression stress-strain behavior of Sn-Ag-Cu solder
    Vianco, PT
    Rejent, JA
    Martin, JJ
    JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 2003, 55 (06): : 50 - 55
  • [4] Long Term Isothermal Aging Effects on the Cyclic Stress-Strain Behavior of Sn-Ag-Cu Solders
    Fu, Nianjun
    Suhling, Jeffrey C.
    Hamasha, Sa'd
    Lall, Pradeep
    PROCEEDINGS OF THE 2017 SIXTEENTH IEEE INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS ITHERM 2017, 2017, : 1337 - 1345
  • [5] Nanoindentation Creep Behavior of Nanocomposite Sn-Ag-Cu Solders
    Roshanghias, A.
    Kokabi, A. H.
    Miyashita, Y.
    Mutoh, Y.
    Ihara, I.
    Fatt, R. G. Guan
    Madaah-Hosseini, H. R.
    JOURNAL OF ELECTRONIC MATERIALS, 2012, 41 (08) : 2057 - 2064
  • [6] Nanoindentation Creep Behavior of Nanocomposite Sn-Ag-Cu Solders
    A. Roshanghias
    A. H. Kokabi
    Y. Miyashita
    Y. Mutoh
    I. Ihara
    R. G. Guan Fatt
    H. R. Madaah-Hosseini
    Journal of Electronic Materials, 2012, 41 : 2057 - 2064
  • [7] Effect of graphene nanosheets on the corrosion behavior of Sn-Ag-Cu solders
    Xu, L. Y.
    Zhang, Z. K.
    Jing, H. Y.
    Wei, J.
    Han, Y. D.
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2015, 26 (08) : 5625 - 5634
  • [8] Investigation of vibration fracture behavior of Sn-Ag-Cu solders under resonance
    Song, JM
    Li, FI
    Lui, TS
    Chen, LH
    JOURNAL OF MATERIALS RESEARCH, 2004, 19 (09) : 2665 - 2673
  • [9] Sn-Ag-Cu and Sn-Cu solders: interfacial reactions with platinum
    Kim, TH
    Kim, YH
    JOM, 2004, 56 (06) : 45 - 49
  • [10] Sn-Ag-Cu and Sn-Cu solders: Interfacial reactions with platinum
    Tae Hyun Kim
    Young-Ho Kim
    JOM, 2004, 56 : 45 - 49