Qualification testing of TPV systems and components: First steps

被引：0
|
作者：
Sala, G. [1 ]
Anton, I.
Dominguez, C.
机构：
[1] Univ Politecn Madrid, Inst Energy Solar, ETSI Telecommun, E-28040 Madrid, Spain
来源：
THERMOPHOTOVOLTAIC GENERATION OF ELECTRICITY | 2007年 / 890卷
关键词：
solar cell qualification; solar cell measurement; TPV cells; TPV emitters; IR optical filters;
D O I：
暂无
中图分类号：
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号：
0807 ; 0820 ;
摘要：
The extreme stresses that must withstand the TPV components ask for an early development of qualification pre-normative. In this paper several methods to check the samples before and after accelerated tests are proposed. The parallelism with concentrator PV us pointed out and used to define testing methods well proven in that technology. Finally a proposal of irradiance standards for TPV cell measurement at production line and for qualification purposes are presented.
引用
收藏
页码：251 / +
页数：2
相关论文
共 50 条
  • [1] QUALIFICATION AND PROOF TESTING OF NUCLEAR COMPONENTS
    MCCORMACK, JE
    [J]. TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, 1978, 30 (NOV): : 494 - 495
  • [2] First wall qualification testing at SNL
    Tanaka, T. J.
    Ying, Alice
    Narula, Manmeet
    Ulrickson, Michael A.
    [J]. 22ND IEEE/NPSS SYMPOSIUM ON FUSION ENGINEERING, 2007, : 66 - +
  • [3] ESD qualification and testing of semiconductor electronic components
    Gross, VP
    Voldman, SH
    Guthrie, WH
    [J]. 46TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE - 1996 PROCEEDINGS, 1996, : 671 - 681
  • [4] Qualification and testing, pumps and valves, materials and components
    Electricite de France, Generation and Engineering, Nuclear Generation Division
    不详
    不详
    [J]. ASME Pressure Vessels Piping Div. Publ. PVP, 2007, (179):
  • [5] Failure mechanisms and qualification testing of passive components
    Post, HA
    Letullier, P
    Briolat, T
    Humke, R
    Schuhmann, R
    Saarinen, K
    Werner, W
    Ousten, Y
    Lekens, G
    Dehbi, A
    Wondrak, W
    [J]. MICROELECTRONICS RELIABILITY, 2005, 45 (9-11) : 1626 - 1632
  • [6] ESD qualification and testing of semiconductor electronic components
    [J]. Proc Electron Compon Technol Conf, (671-681):
  • [7] Challenges in the Qualification of Electronic Components and Systems
    Challa, Vidyu
    Rundle, Peter
    Pecht, Michael
    [J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2013, 13 (01) : 26 - 35
  • [8] Methods for Distributed Qualification of Components and Variants in Vehicle Testing
    Ungermann, Jochen
    Heuler, Paul
    [J]. MATERIALS TESTING, 2011, 53 (03) : 91 - 97
  • [9] QUALIFICATION AND PROOF TESTING OF ELECTRICAL COMPONENTS - TRANSITORY PHASE
    PACE, RA
    [J]. TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, 1978, 30 (NOV): : 491 - 492
  • [10] SEISMIC QUALIFICATION OF SYSTEMS, STRUCTURES, EQUIPMENT AND COMPONENTS
    FISCHER, EG
    [J]. NUCLEAR ENGINEERING AND DESIGN, 1978, 46 (01) : 151 - 167
12345