Hysteresis and 360 degrees domain wall structures in antiferromagnetically coupled multilayers with linear defects

被引：1
|
作者：
Berkov, DV
Gorn, NL
Andra, W
Mattheis, R
Schmidt, S
机构：
[1] Institut für Physikalische, Hochtechnologie e. V., PF 100239
来源：
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 1996年 / 158卷 / 01期
关键词：
D O I：
10.1002/pssa.2211580126
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The influence of linear defects on both the magnetization curve M(H) and the magnetoresistance R(H) of antiferromagnetically (AF) coupled Co/Cu multilayers is studied by numerical simulations. In agreement with the behaviour observed experimentally we find irreversibility for a wide range of external fields. Additionally the simulations predict the appearance of magnetization structures similar to 360 degrees domain walls. The field range of their existence is calculated as a function of the AF coupling strength for two typical defect configurations.
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页码：247 / 258
页数：12
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